Reshma Menon R ; Dr. Seema Bahinipati

2021
INDIAN INSTITUTE OF TECHNOLOGY BHUBANESWAR ODISHA,INDIA

Abstract: Track finding efficiency is a vital input to various sources of systematic uncertainties in analyses involving charged particles.Method to calculate tracking efficiency for hadrons is different than that for muons due their decays and interactions with the material of the detector.Therefore, here we describe a method of estimating the relative tracking efficiency of slow pions in data compared to simulation by focusing on B0→ D∗− π+ decay where the D∗− further decays to D̄0 π− .Owing to its limited phase space,the pion from D∗ decay is traditionally referred as slow-pion due to a small mass difference between the D∗ and D̄0. The main aim of this project is to determine the relative tracking efficiency of this slow pion in data and simulation by measuring the efficiency corrected yield ratio for D̄0 → K- π+ π- π+ mode relative to that for the two-body decay D̄0 → K- π+ . Besides this,the project also aims at maintaining the health of the sub-detector:Silicon Vertex Detector(SVD) at Belle II.The main purpose of SVD is to determine the decay vertices and to precisely measure the momentum of charged particles.Regular electrical tests are conducted to check the correct functionality and to identify the possible defects of the electrically active components.Here we try to understand,classify and analyse the electrical defects of the SVD sensors.We also aim to understand the effect of radiation damage in increasing the number of defects(majorly pinholes) in a sensor.These defects obtained on electrical characterisation of SVD sensors need to be fixed at regular intervals in order to have precise measurements.

Note: Presented on 15 05 2021
Note: MSc